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Formation of Nanocrystalline Germanium via Oxidation of Si₀.₅₄Ge₀.₄₆ for Memory Device Applications

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dc.creator Kan, Eric Win Hong
dc.creator Leoy, C.C.
dc.creator Choi, Wee Kiong
dc.creator Chim, Wai Kin
dc.creator Antoniadis, Dimitri A.
dc.creator Fitzgerald, Eugene A.
dc.date 2003-11-24T20:46:06Z
dc.date 2003-11-24T20:46:06Z
dc.date 2003-01
dc.date.accessioned 2013-10-09T02:32:11Z
dc.date.available 2013-10-09T02:32:11Z
dc.date.issued 2013-10-09
dc.identifier http://hdl.handle.net/1721.1/3722
dc.identifier.uri http://koha.mediu.edu.my:8181/xmlui/handle/1721
dc.description In this work, we studied the possibility of synthesizing nanocrystalline germanium (Ge) via dry and wet oxidation of both amorphous and polycrystalline Si₀.₅₄Ge₀.₄₆ films. In dry oxidation, Ge was rejected from the growing SiO₂ forming a Ge-rich polycrystalline layer. As for wet oxidation, Ge was incorporated into the oxide, forming a layer of mixed oxide, SixGe₁â xOy. Formation of nanocrystalline Ge was observed when the layer of SixGe₁â xOy was annealed in a N₂ ambient. We have fabricated a metal-insulator-semiconductor structure with nanocrystalline Ge embedded within the insulator layer to study its feasibility as a memory device.
dc.description Singapore-MIT Alliance (SMA)
dc.format 497248 bytes
dc.format application/pdf
dc.language en_US
dc.relation Advanced Materials for Micro- and Nano-Systems (AMMNS);
dc.subject germanium nanocrystal
dc.subject silicon-germanium
dc.subject oxidation
dc.title Formation of Nanocrystalline Germanium via Oxidation of Si₀.₅₄Ge₀.₄₆ for Memory Device Applications
dc.type Article


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