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Research on the Simplified Model for Fine Stripes of Filarnet Piffraction

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dc.creator YANG Wen-tao
dc.creator NI Yan-hai
dc.creator LIANG Yi-ping
dc.creator DU Liang
dc.creator WEI Jia-ju
dc.creator WU Yu
dc.date 2011
dc.date.accessioned 2013-05-30T12:03:13Z
dc.date.available 2013-05-30T12:03:13Z
dc.date.issued 2013-05-30
dc.identifier http://journal.cqnu.edu.cn/1104/pdf/0413.pdf
dc.identifier http://www.doaj.org/doaj?func=openurl&genre=article&issn=16726693&date=2011&volume=28&issue=4&spage=53
dc.identifier.uri http://koha.mediu.edu.my:8181/jspui/handle/123456789/4973
dc.description The phenomenon that some extra fine slim stripes overlays on all of the Fraunhofe diffraction bright spots by filament has potential application in untouched optical measurement, manufacturing technique of diffraction grating, encrypted communication and antistealth technology etc. Based on physicl optics diffraction theory, Fourier analysis was applied to sudy the fine stripes and a model was establish for the fine structure of the filament diffraction. The mathematical formula of the diffraction light intensity distribution is given by *. Excluding coefficient errors, the number of the fine slim stripes in the zero-order diffraction spot is direct proportion *. The theory could better explain all phenomena obtained in the experiments.(* Indicates a formula, please see the full text)
dc.publisher Chongqing Normal University
dc.source Journal of Chongqing Normal University
dc.subject afilament diffraction
dc.subject Fraunhofer diffraction
dc.subject fine slim stripes
dc.subject sinc function
dc.subject modulate
dc.title Research on the Simplified Model for Fine Stripes of Filarnet Piffraction


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