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Modelagem dos processos químicos em plasmas de misturas gasosas usadas na corrosão de silício. Parte 2: SF6 / O2

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dc.creator Bauerfeldt G. F.
dc.creator Arbilla G.
dc.date 1998
dc.date.accessioned 2013-05-30T10:38:39Z
dc.date.available 2013-05-30T10:38:39Z
dc.date.issued 2013-05-30
dc.identifier http://www.scielo.br/scielo.php?script=sci_arttext&pid=S0100-40421998000100006
dc.identifier http://www.doaj.org/doaj?func=openurl&genre=article&issn=01004042&date=1998&volume=21&issue=1&spage=34
dc.identifier.uri http://koha.mediu.edu.my:8181/jspui/handle/123456789/4113
dc.description In this work, a numerical modeling analysis of the gas-phase decomposition of SF6 / O2 mixtures, in the presence of silicon, was performed. The relative importance of individual processes and the effect of the parameters' uncertainties were determined. The model was compared with experimental data for the plasma etching of silicon and with the calculated results for the CF4 / O2 system. In both systems the main etching agent is the fluorine atom and the concentration of the major species depends on the composition of the mixture. The etching rate is greater for SF6 / O2.
dc.publisher Sociedade Brasileira de Química
dc.source Química Nova
dc.subject plasma etching
dc.subject numerical modeling
dc.subject SF6 decomposition
dc.title Modelagem dos processos químicos em plasmas de misturas gasosas usadas na corrosão de silício. Parte 2: SF6 / O2


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