| dc.creator |
Wypych F. |
|
| dc.creator |
Weber Th. |
|
| dc.creator |
Prins R. |
|
| dc.date |
1998 |
|
| dc.date.accessioned |
2013-05-30T10:36:09Z |
|
| dc.date.available |
2013-05-30T10:36:09Z |
|
| dc.date.issued |
2013-05-30 |
|
| dc.identifier |
http://www.scielo.br/scielo.php?script=sci_arttext&pid=S0100-40421998000100001 |
|
| dc.identifier |
http://www.doaj.org/doaj?func=openurl&genre=article&issn=01004042&date=1998&volume=21&issue=1&spage=5 |
|
| dc.identifier.uri |
http://koha.mediu.edu.my:8181/jspui/handle/123456789/4093 |
|
| dc.description |
Scanning tunnelling microscopy (STM) was used to characterise the basal surface of fresh cleaved crystals of 2H-WS2. Although no impurity or stacking faults could be detected by X-ray diffraction, STM images obtained with negative bias voltage showed two kinds of defects. These defects were attributed to an iodine derivative used as transport agent. In a flat surface free of defects, an image with atomic resolution was achieved with sulphur distances and angles as expected for hexagonal symmetry of 2H-WS2. |
|
| dc.publisher |
Sociedade Brasileira de Química |
|
| dc.source |
Química Nova |
|
| dc.subject |
scanning tunnelling microscopy |
|
| dc.subject |
tungsten disulphide |
|
| dc.subject |
catalysis |
|
| dc.title |
Defeitos superficiais em 2H-WS2 observados por microscopia de tunelamento |
|