| dc.creator |
Jacob Wolfgang |
|
| dc.creator |
Keudell Achim vom |
|
| dc.creator |
Schwarz-Selinger Thomas |
|
| dc.date |
2001 |
|
| dc.date.accessioned |
2013-05-30T00:44:41Z |
|
| dc.date.available |
2013-05-30T00:44:41Z |
|
| dc.date.issued |
2013-05-30 |
|
| dc.identifier |
http://www.scielo.br/scielo.php?script=sci_arttext&pid=S0103-97332001000100019 |
|
| dc.identifier |
http://www.doaj.org/doaj?func=openurl&genre=article&issn=01039733&date=2001&volume=31&issue=1&spage=109 |
|
| dc.identifier.uri |
http://koha.mediu.edu.my:8181/jspui/handle/123456789/3162 |
|
| dc.publisher |
Sociedade Brasileira de Física |
|
| dc.source |
Brazilian Journal of Physics |
|
| dc.title |
Infrared analysis of thin films: amorphous, hydrogenated carbon on silicon |
|