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dc.creator Tessler Leandro R.
dc.date 1999
dc.date.accessioned 2013-05-29T23:18:54Z
dc.date.available 2013-05-29T23:18:54Z
dc.date.issued 2013-05-30
dc.identifier http://www.scielo.br/scielo.php?script=sci_arttext&pid=S0103-97331999000400003
dc.identifier http://www.doaj.org/doaj?func=openurl&genre=article&issn=01039733&date=1999&volume=29&issue=4&spage=616
dc.identifier.uri http://koha.mediu.edu.my:8181/jspui/handle/123456789/2699
dc.description A review of the current status of research on Er 3+ doped hydrogenated amorphous silicon (a-Si:H) is presented. Er has been introduced in a-Si:H and a-SiOx:H by ion implantation, co-sputtering and PECVD. In all cases, the characteristic atomic-like intra-4f 4I13/2 -> 4I15/2 photoluminescence emission at ~ 1.54 µm is observed at room temperature. The Er 3+ luminescence probability is determined by the local neighborhood of the ions. Therefore, local probes like EXAFS and Mössbauer spectroscopy have yielded very important information. A discussion of excitation processes, electroluminescence, and electronic doping effects, is also presented.
dc.publisher Sociedade Brasileira de Física
dc.source Brazilian Journal of Physics
dc.title Erbium in a-Si:H


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