| dc.creator |
López-Ríos, T. |
|
| dc.creator |
Briggs, A |
|
| dc.creator |
Guillet, S. |
|
| dc.creator |
Baró, A. M. |
|
| dc.creator |
Luna, Mónica |
|
| dc.date |
2008-05-16T09:42:28Z |
|
| dc.date |
2008-05-16T09:42:28Z |
|
| dc.date |
1995-01-23 |
|
| dc.date.accessioned |
2017-01-31T01:20:27Z |
|
| dc.date.available |
2017-01-31T01:20:27Z |
|
| dc.identifier |
Appl. Phys. Lett. 66 (4), 529 (1995) |
|
| dc.identifier |
003-6951 |
|
| dc.identifier |
http://hdl.handle.net/10261/4299 |
|
| dc.identifier.uri |
http://dspace.mediu.edu.my:8181/xmlui/handle/10261/4299 |
|
| dc.description |
The electrical conductivity between 4 and 300 K of Ag thin films (up to 30 mm grown at room temperature on Si(100) vicinal surfaces has been measured and their morphology imaged with an atomic force microscope. A noticeable anisotropy of the resistivity of the films which is related to the structure of the films has been found) |
|
| dc.description |
Laboratories du CNRS
Departamento de Física Materia Condensada. Universidad Autónoma. |
|
| dc.description |
Peer reviewed |
|
| dc.format |
143459 bytes |
|
| dc.format |
application/pdf |
|
| dc.language |
eng |
|
| dc.publisher |
American Institute of Physics |
|
| dc.rights |
openAccess |
|
| dc.subject |
Thin films |
|
| dc.title |
Anisotropic conductivity of silver thin films grown on silicon (100) vicinal surfaces |
|
| dc.type |
Artículo |
|