Anisotropic conductivity of silver thin films grown on silicon (100) vicinal surfaces

dc.creator	López-Ríos, T.
dc.creator	Briggs, A
dc.creator	Guillet, S.
dc.creator	Baró, A. M.
dc.creator	Luna, Mónica
dc.date	2008-05-16T09:42:28Z
dc.date	2008-05-16T09:42:28Z
dc.date	1995-01-23
dc.date.accessioned	2017-01-31T01:20:27Z
dc.date.available	2017-01-31T01:20:27Z
dc.identifier	Appl. Phys. Lett. 66 (4), 529 (1995)
dc.identifier	003-6951
dc.identifier	http://hdl.handle.net/10261/4299
dc.identifier.uri	http://dspace.mediu.edu.my:8181/xmlui/handle/10261/4299
dc.description	The electrical conductivity between 4 and 300 K of Ag thin films (up to 30 mm grown at room temperature on Si(100) vicinal surfaces has been measured and their morphology imaged with an atomic force microscope. A noticeable anisotropy of the resistivity of the films which is related to the structure of the films has been found)
dc.description	Laboratories du CNRS Departamento de Física Materia Condensada. Universidad Autónoma.
dc.description	Peer reviewed
dc.format	143459 bytes
dc.format	application/pdf
dc.language	eng
dc.publisher	American Institute of Physics
dc.rights	openAccess
dc.subject	Thin films
dc.title	Anisotropic conductivity of silver thin films grown on silicon (100) vicinal surfaces
dc.type	Artículo

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