The electrical conductivity between 4 and 300 K of Ag thin films (up to 30 mm grown at room temperature on Si(100) vicinal surfaces has been measured and their morphology imaged with an atomic force microscope. A noticeable anisotropy of the resistivity of the films which is related to the structure of the films has been found)Laboratories du CNRS Departamento de Física Materia Condensada. Universidad Autónoma.Peer reviewed