أعرض تسجيلة المادة بشكل مبسط

dc.creator Guerra, Oscar
dc.creator Escalera, Sara
dc.creator Rosa, José M. de la
dc.creator Compaigne, Eric
dc.creator Galliard, Christophe
dc.creator Rodríguez-Vázquez, Ángel
dc.date 2008-04-29T05:49:23Z
dc.date 2008-04-29T05:49:23Z
dc.date 2000-11
dc.date.accessioned 2017-01-31T01:05:42Z
dc.date.available 2017-01-31T01:05:42Z
dc.identifier O. Guerra, S. Escalera, J.M. de la Rosa, E. Compaigne, C. Galliard and A. Rodríguez-Vázquez: "Selection of test techniques for high-resolution ΣΔ modulators”, Proceeding of the 2004 Conference on Design of Circuits and Integrated Systems, pp. 211-214, Bordeaux, November 2004.
dc.identifier 2-9522971-0-X
dc.identifier http://hdl.handle.net/10261/3845
dc.identifier.uri http://dspace.mediu.edu.my:8181/xmlui/handle/10261/3845
dc.description This paper introduces a new tool which allows the evaluation of different test techniques in a complete impartial manner. This tool has been applied to the selection of the best test technique for their application to high-resolution ΣΔ modulators. Besides, three of these techniques have been presented.
dc.description This work has been supported by the EU ESPRIT IST Project 2001-34283/TAMES_2 and the spanish CICYT Project TIC - 2001-0929/ADAVERE.
dc.description Peer reviewed
dc.format 215836 bytes
dc.format application/pdf
dc.language eng
dc.rights openAccess
dc.subject Test
dc.subject Sigma-Delta Modulators
dc.title Selection of test techniques for high-resolution ΣΔ modulators
dc.type Artículo


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أعرض تسجيلة المادة بشكل مبسط