| dc.creator |
Guerra, Oscar |
|
| dc.creator |
Escalera, Sara |
|
| dc.creator |
Rosa, José M. de la |
|
| dc.creator |
Compaigne, Eric |
|
| dc.creator |
Galliard, Christophe |
|
| dc.creator |
Rodríguez-Vázquez, Ángel |
|
| dc.date |
2008-04-29T05:49:23Z |
|
| dc.date |
2008-04-29T05:49:23Z |
|
| dc.date |
2000-11 |
|
| dc.date.accessioned |
2017-01-31T01:05:42Z |
|
| dc.date.available |
2017-01-31T01:05:42Z |
|
| dc.identifier |
O. Guerra, S. Escalera, J.M. de la Rosa, E. Compaigne, C. Galliard and A. Rodríguez-Vázquez: "Selection of test techniques for high-resolution ΣΔ modulators”, Proceeding of the 2004 Conference on Design of Circuits and Integrated Systems, pp. 211-214, Bordeaux, November 2004. |
|
| dc.identifier |
2-9522971-0-X |
|
| dc.identifier |
http://hdl.handle.net/10261/3845 |
|
| dc.identifier.uri |
http://dspace.mediu.edu.my:8181/xmlui/handle/10261/3845 |
|
| dc.description |
This paper introduces a new tool which allows the
evaluation of different test techniques in a complete impartial manner. This tool has been applied to the selection of the best
test technique for their application to high-resolution ΣΔ modulators. Besides, three of these techniques have been presented. |
|
| dc.description |
This work has been supported by the EU ESPRIT IST Project 2001-34283/TAMES_2 and the spanish CICYT Project TIC - 2001-0929/ADAVERE. |
|
| dc.description |
Peer reviewed |
|
| dc.format |
215836 bytes |
|
| dc.format |
application/pdf |
|
| dc.language |
eng |
|
| dc.rights |
openAccess |
|
| dc.subject |
Test |
|
| dc.subject |
Sigma-Delta Modulators |
|
| dc.title |
Selection of test techniques for high-resolution ΣΔ modulators |
|
| dc.type |
Artículo |
|