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Analysis and Modeling of the Non-Linear Sampling Process in Switched-Current Circuits - Application to Bandpass Sigma-Delta Modulators

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dc.creator Rosa, José M. de la
dc.creator Pérez-Verdú, Belén
dc.creator Medeiro, Fernando
dc.creator Río, Rocío del
dc.creator Rodríguez-Vázquez, Ángel
dc.date 2008-04-28T16:41:11Z
dc.date 2008-04-28T16:41:11Z
dc.date 2001-08
dc.date.accessioned 2017-01-31T01:05:31Z
dc.date.available 2017-01-31T01:05:31Z
dc.identifier J.M. de la Rosa, B. Pérez-Verdú, F. Medeiro, R. del Río and A. Rodríguez-Vázquez, “Analysis and Modeling of the Non-Linear Sampling Process in Switched-Current Circuits - Applications to Bandpass Sigma-Delta Modulators”. Proc. of the 15th European Conference on Circuit Theory and Design, pp. I.309-I.312, Espoo (Finland), August 2001.
dc.identifier http://hdl.handle.net/10261/3838
dc.identifier.uri http://dspace.mediu.edu.my:8181/xmlui/handle/10261/3838
dc.description This paper presents a precise model for the transient behaviour of Fully Differential (FD) SwItched-current (SI) memory cells placed at the front-end of high-speed A/D interfaces. This model allows us to analyze the main errors associated to the S/H process, namely: excess transfer-function delay and harmonic distortion. For the latter, the analysis is extended to BandPass ΣΔ Modulators (BP-ΣΔMs) and a closed-form expression is derived for the third-order intermodulation distortion. Time-domain simulations and experimental measurements taken from a 0.8μm CMOS 4th-order BP-ΣΔM silicon prototype validate our approach.
dc.description Peer reviewed
dc.format 185319 bytes
dc.format application/pdf
dc.language eng
dc.publisher Institute of Electrical and Electronics Engineers
dc.rights openAccess
dc.subject Switched-Current Circuits
dc.subject Bandpass Sigma-Delta Modulators
dc.title Analysis and Modeling of the Non-Linear Sampling Process in Switched-Current Circuits - Application to Bandpass Sigma-Delta Modulators
dc.type Artículo


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