| dc.creator |
Escalera, Sara |
|
| dc.creator |
García-González, José Manuel |
|
| dc.creator |
Guerra, Oscar |
|
| dc.creator |
Rosa, José M. de la |
|
| dc.creator |
Medeiro, Fernando |
|
| dc.creator |
Pérez-Verdú, Belén |
|
| dc.creator |
Rodríguez-Vázquez, Ángel |
|
| dc.date |
2008-04-28T11:10:36Z |
|
| dc.date |
2008-04-28T11:10:36Z |
|
| dc.date |
2004-05 |
|
| dc.date.accessioned |
2017-01-31T01:04:37Z |
|
| dc.date.available |
2017-01-31T01:04:37Z |
|
| dc.identifier |
S. Escalera, J.M. García-González, O. Guerra, J.M. de la Rosa, F. Medeiro, B. Pérez-Verdú and A. Rodríguez-Vázquez: "An Alternative DfT Methodology to Test High-Resolution ΣΔ Modulator". Proceeding of the 2004 International Symposium on Circuits and Systems (ISCAS), pp. I.257-I.260, Vancouver, May 2004. |
|
| dc.identifier |
http://hdl.handle.net/10261/3794 |
|
| dc.identifier |
0-7803-8251-X/04 |
|
| dc.identifier.uri |
http://dspace.mediu.edu.my:8181/xmlui/handle/10261/3794 |
|
| dc.description |
In this paper, a novel DfT methodology to test high-resolution ΣΔ Modulators (ΣΔM) is introduced. The aim of the proposal is to reduce the test time required by conventional methodologies without degrading the accuracy of the results. A detailed description of the additional circuitry needed to perform these tests is presented as well as some initial simulation results to show the utility of the approach. |
|
| dc.description |
Peer reviewed |
|
| dc.format |
450773 bytes |
|
| dc.format |
application/pdf |
|
| dc.language |
eng |
|
| dc.publisher |
Institute of Electrical and Electronics Engineers |
|
| dc.rights |
openAccess |
|
| dc.subject |
Design for Testability |
|
| dc.subject |
Sigma-Delta Modulators |
|
| dc.title |
An Alternative DfT Methodology to Test High-Resolution ΣΔ Modulators |
|
| dc.type |
Artículo |
|