أعرض تسجيلة المادة بشكل مبسط
| dc.creator |
Zaldo, Carlos |
|
| dc.creator |
Albella, J. M. |
|
| dc.creator |
Fornies, Eduardo |
|
| dc.date |
2008-01-16T17:14:22Z |
|
| dc.date |
2008-01-16T17:14:22Z |
|
| dc.date |
2007-06-13 |
|
| dc.date.accessioned |
2017-01-31T00:59:43Z |
|
| dc.date.available |
2017-01-31T00:59:43Z |
|
| dc.identifier |
European Patent Code: EP 1662227 B1 |
|
| dc.identifier |
http://hdl.handle.net/10261/2697 |
|
| dc.identifier.uri |
http://dspace.mediu.edu.my:8181/xmlui/handle/10261/2697 |
|
| dc.description |
Filing Date: 2004-07-14.-- Priority Data: ES 200301666 (2003-07-15).-- International Publication Number: WO_2005008175 (20050127). |
|
| dc.description |
This invention is related to the production engineering industry, and more particularly to the sector concerned with the production of photovoltaic cells, and therefore it also has a bearing on the alternative energy
sector. The invention relates to the control of the methods used for texturing the surface of monocrystalline silicon,
although it is also applicable to the textures developed on the surface of silicon and other multicrystalline and
polycrystalline semiconductors. |
|
| dc.format |
579657 bytes |
|
| dc.format |
application/pdf |
|
| dc.language |
eng |
|
| dc.rights |
openAccess |
|
| dc.title |
Optical method and device for texture quantification of photovoltaic cells |
|
| dc.type |
Patente |
|
الملفات في هذه المادة
|
لا توجد أي ملفات مرتبطة بهذه المادة.
|
هذه المادة تبدو في المجموعات التالية:
أعرض تسجيلة المادة بشكل مبسط