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http://dspace.mediu.edu.my:8181/xmlui/handle/1721.1/5029Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor | Eisenstein, A. S. | - |
| dc.date | 2004-03-03T22:19:04Z | - |
| dc.date | 2004-03-03T22:19:04Z | - |
| dc.date | 1946 | - |
| dc.date.accessioned | 2013-10-09T02:37:20Z | - |
| dc.date.available | 2013-10-09T02:37:20Z | - |
| dc.date.issued | 2013-10-09 | - |
| dc.identifier | no. 17 | - |
| dc.identifier | http://hdl.handle.net/1721.1/5029 | - |
| dc.identifier.uri | http://koha.mediu.edu.my:8181/xmlui/handle/1721 | - |
| dc.description | [by] A. Eisenstein. | - |
| dc.description | "Reprinted from Journal of applied physics, vol. 17, No. 11, 874-878, November, 1946." | - |
| dc.description | Includes bibliographical references. | - |
| dc.format | p. 874-878 | - |
| dc.format | 487443 bytes | - |
| dc.format | application/pdf | - |
| dc.language | eng | - |
| dc.publisher | Research Laboratory of Electronics, Massachusetts Institute of Technology | - |
| dc.relation | Technical report (Massachusetts Institute of Technology. Research Laboratory of Electronics) ; 17. | - |
| dc.subject | TK7855.M41 R43 no.17 | - |
| dc.subject | Thin films | - |
| dc.title | An x-ray method for measuring the thickness of thin crystalline films | - |
| Appears in Collections: | MIT Items | |
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