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http://dspace.mediu.edu.my:8181/xmlui/handle/1721.1/5029| Title: | An x-ray method for measuring the thickness of thin crystalline films |
| Authors: | Eisenstein, A. S. |
| Keywords: | TK7855.M41 R43 no.17 Thin films |
| Issue Date: | 9-Oct-2013 |
| Publisher: | Research Laboratory of Electronics, Massachusetts Institute of Technology |
| Description: | [by] A. Eisenstein. "Reprinted from Journal of applied physics, vol. 17, No. 11, 874-878, November, 1946." Includes bibliographical references. |
| URI: | http://koha.mediu.edu.my:8181/xmlui/handle/1721 |
| Other Identifiers: | no. 17 http://hdl.handle.net/1721.1/5029 |
| Appears in Collections: | MIT Items |
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