Statistics of switching-time jitter for a tunnel diode threshold-crossing detector.

Please use this identifier to cite or link to this item: http://dspace.mediu.edu.my:8181/xmlui/handle/1721.1/4287

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DC Field	Value	Language
dc.contributor	Nelsen, Donald E. (Donald Edward)	-
dc.date	2004-03-02T18:54:41Z	-
dc.date	2004-03-02T18:54:41Z	-
dc.date	1967	-
dc.date.accessioned	2013-10-09T02:34:51Z	-
dc.date.available	2013-10-09T02:34:51Z	-
dc.date.issued	2013-10-09	-
dc.identifier	456	-
dc.identifier	http://hdl.handle.net/1721.1/4287	-
dc.identifier.uri	http://koha.mediu.edu.my:8181/xmlui/handle/1721	-
dc.description	Issued also as a Ph.D. Thesis in the Dept. of Electrical Engineering, 1966.	-
dc.description	Bibliography: p.56.	-
dc.format	iv, 56 p.	-
dc.format	3670413 bytes	-
dc.format	application/pdf	-
dc.language	eng	-
dc.publisher	MIT Research Laboratory of Electronics	-
dc.relation	Technical report (Massachusetts Institute of Technology. Research Laboratory of Electronics) ; 456.	-
dc.subject	TK7855.M41 R43 no.456	-
dc.subject	Tunnel diodes	-
dc.subject	Electronic circuits	-
dc.subject	Switching theory	-
dc.subject	Threshold logic	-
dc.title	Statistics of switching-time jitter for a tunnel diode threshold-crossing detector.	-
Appears in Collections:	MIT Items

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