Fault-tolerant round robin A/D converter system

Please use this identifier to cite or link to this item: http://dspace.mediu.edu.my:8181/xmlui/handle/1721.1/4191

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DC Field	Value	Language
dc.contributor	Beckmann, Paul Eric.	-
dc.contributor	Musicus, Bruce Ronald.	-
dc.date	2004-03-02T18:29:42Z	-
dc.date	2004-03-02T18:29:42Z	-
dc.date	1990	-
dc.date.accessioned	2013-10-09T02:34:25Z	-
dc.date.available	2013-10-09T02:34:25Z	-
dc.date.issued	2013-10-09	-
dc.identifier	no.561	-
dc.identifier	http://hdl.handle.net/1721.1/4191	-
dc.identifier.uri	http://koha.mediu.edu.my:8181/xmlui/handle/1721	-
dc.description	Paul E. Beckmann and Bruce R. Musicus.	-
dc.description	Includes bibliographical references (leaves 54-55).	-
dc.description	Research supported in part by the Draper Laboratories. DL-H-404158 Research supported in part by a Rockwell Doctoral Fellowship. Research supported in part by the Advanced Research Projects Agency, monitored by the Office of Naval Research. N00014-89-J-1489	-
dc.format	55 leaves	-
dc.format	2451012 bytes	-
dc.format	application/pdf	-
dc.language	eng	-
dc.publisher	Research Laboratory of Electronics, Massachusetts Institute of Technology	-
dc.relation	Technical report (Massachusetts Institute of Technology. Research Laboratory of Electronics) ; 561.	-
dc.subject	TK7855.M41 R43 no.561	-
dc.title	Fault-tolerant round robin A/D converter system	-
Appears in Collections:	MIT Items

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