Please use this identifier to cite or link to this item: http://dspace.mediu.edu.my:8181/xmlui/handle/1721.1/3985
Title: SiGeC Near Infrared Photodetectors
Keywords: photodetector
quantum efficiency
absorption coefficient
absorption efficiency
band gap
lattice constant
critical thickness
SiGeC
semiconductor
alloy
Issue Date: 9-Oct-2013
Description: A near infrared waveguide photodetector in Si-based ternary Si₁â xâ yGexCy alloy was demonstrated for 0.85~1.06 µm wavelength fiber-optic interconnection system applications. Two sets of detectors with active absorption layer compositions of Si₀.₇₉Ge₀.₂C₀.₀₁ and Si₀.₇₀Ge₀.₂₈C₀.₀₂ were designed. The active absorption layer has a thickness of 120~450 nm. The external quantum efficiency can reach ~3% with a cut-off wavelength of around 1.2 µm.
Singapore-MIT Alliance (SMA)
URI: http://koha.mediu.edu.my:8181/xmlui/handle/1721
Other Identifiers: http://hdl.handle.net/1721.1/3985
Appears in Collections:MIT Items

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