Substrate Resistance Extraction Using a Multi-Domain Surface Integral Formulation

Please use this identifier to cite or link to this item: http://dspace.mediu.edu.my:8181/xmlui/handle/1721.1/3923

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DC Field	Value	Language
dc.creator	Vithayathil, Anne	-
dc.creator	Hu, Xin	-
dc.creator	White, Jacob K.	-
dc.date	2003-12-15T20:45:35Z	-
dc.date	2003-12-15T20:45:35Z	-
dc.date	2004-01	-
dc.date.accessioned	2013-10-09T02:33:13Z	-
dc.date.available	2013-10-09T02:33:13Z	-
dc.date.issued	2013-10-09	-
dc.identifier	http://hdl.handle.net/1721.1/3923	-
dc.identifier.uri	http://koha.mediu.edu.my:8181/xmlui/handle/1721	-
dc.description	In order to assess and optimize layout strategies for minimizing substrate noise, it is necessary to have fast and accurate techniques for computing contact coupling resistances associated with the substrate. In this talk, we describe an extraction method capable of full-chip analysis which combines modest geometric approximations, a novel integral formulation, and an FFT-accelerated preconditioned iterative method.	-
dc.description	Singapore-MIT Alliance (SMA)	-
dc.format	10535 bytes	-
dc.format	application/pdf	-
dc.language	en_US	-
dc.relation	High Performance Computation for Engineered Systems (HPCES);	-
dc.subject	substrate resistance extraction	-
dc.subject	multi-domain surface integral formulation	-
dc.subject	substrate noise	-
dc.subject	coupling resistances	-
dc.title	Substrate Resistance Extraction Using a Multi-Domain Surface Integral Formulation	-
dc.type	Article	-
Appears in Collections:	MIT Items

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