On Dual Actuation in Atomic Force Microscopes

Please use this identifier to cite or link to this item: http://dspace.mediu.edu.my:8181/xmlui/handle/1721.1/3914

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DC Field	Value	Language
dc.creator	El Rifai, Khalid	-
dc.creator	El Rifai, Osamah M.	-
dc.creator	Youcef-Toumi, Kamal	-
dc.date	2003-12-15T12:00:00Z	-
dc.date	2003-12-15T12:00:00Z	-
dc.date	2004-01	-
dc.date.accessioned	2013-10-09T02:33:10Z	-
dc.date.available	2013-10-09T02:33:10Z	-
dc.date.issued	2013-10-09	-
dc.identifier	http://hdl.handle.net/1721.1/3914	-
dc.identifier.uri	http://koha.mediu.edu.my:8181/xmlui/handle/1721	-
dc.description	In this paper, the problem of dual actuation in the atomic force microscope (AFM) is analyzed. The use of two actuators to balance the trade-off between bandwidth, range, and precision has been recently extended to nano-positioning systems. Despite existing demands, this concept undergoes fundamental limitations towards its extension to AFMs. This is attributed to the non-conventional requirement imposed on the control signal response, as it used to create the image of the characterized surface.	-
dc.description	Singapore-MIT Alliance (SMA)	-
dc.format	324338 bytes	-
dc.format	application/pdf	-
dc.language	en_US	-
dc.relation	Innovation in Manufacturing Systems and Technology (IMST);	-
dc.subject	dual actuation	-
dc.subject	atomic force microscope	-
dc.subject	piezotube	-
dc.subject	piezocantilever	-
dc.subject	plant transfer functions	-
dc.subject	feedback systems	-
dc.title	On Dual Actuation in Atomic Force Microscopes	-
dc.type	Article	-
Appears in Collections:	MIT Items

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