Please use this identifier to cite or link to this item: http://dspace.mediu.edu.my:8181/xmlui/handle/1721.1/3670
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dc.creatorThompson, Carl V.-
dc.date2003-11-10T20:18:14Z-
dc.date2003-11-10T20:18:14Z-
dc.date2003-01-
dc.date.accessioned2013-10-09T02:31:53Z-
dc.date.available2013-10-09T02:31:53Z-
dc.date.issued2013-10-09-
dc.identifierhttp://hdl.handle.net/1721.1/3670-
dc.identifier.urihttp://koha.mediu.edu.my:8181/xmlui/handle/1721-
dc.descriptionPolycrystalline films are used in a wide array of micro- and nano-scale devices, for electronic, mechanical, magnetic, photonic and chemical functions. Increasingly, the properties, performance, and reliability of films in these systems depend on nano-scale structure. In collaborative research with a number of SMA Fellows, Associates, and students, our group is carrying out research focused on probing, modeling and controlling nano-scale structural evolution during both vapor-phase and solid-phase polycrystalline film formation. In particular, high-sensitivity in-situ and real-time stress measurements are being used to study atomic scale forces and to characterize structure formation and evolution at the nano-scale. In other collaborative research, the affects of controlled structure and multi-film architectures on properties, such as piezoelectric characteristics and electromigration-limited reliability, are being explored. Through these interrelated activities, basic principles of the science and engineering of nano-scale materials are emerging.-
dc.descriptionSingapore-MIT Alliance (SMA)-
dc.format315579 bytes-
dc.formatapplication/pdf-
dc.languageen_US-
dc.relationAdvanced Materials for Micro- and Nano-Systems (AMMNS);-
dc.subjectinterconnects-
dc.subjectMEMS-
dc.subjectstress-
dc.subjectthin films-
dc.titleResearch on Polycrystalline Films for Micro- and Nano-Systems-
dc.typeArticle-
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