Successive sampling and software reliability

Please use this identifier to cite or link to this item: http://dspace.mediu.edu.my:8181/xmlui/handle/1721.1/2365

Full metadata record

DC Field	Value	Language
dc.contributor	Kaufman, Gordon M.	-
dc.contributor	Sloan School of Management.	-
dc.date	2003-04-29T05:05:36Z	-
dc.date	2003-04-29T05:05:36Z	-
dc.date	1992	-
dc.date.accessioned	2013-06-01T00:48:15Z	-
dc.date.available	2013-06-01T00:48:15Z	-
dc.date.issued	2013-06-01	-
dc.identifier	3316	-
dc.identifier	http://hdl.handle.net/1721.1/2365	-
dc.identifier.uri	http://koha.mediu.edu.my:8181/jspui/handle/1721	-
dc.description	by Gordon M. Kaufman.	-
dc.description	Includes bibliographical references (p. [12]-[13]).	-
dc.description	Supported by AFOSR. AFOSR-890371	-
dc.format	22, [5] p. of plates : ill.	-
dc.format	1648627 bytes	-
dc.format	application/pdf	-
dc.language	eng	-
dc.publisher	Alfred P. Sloan School of Management, Massachusetts Institute of Technology	-
dc.relation	Working paper (Sloan School of Management) ; 3316-92.	-
dc.subject	HD28 .M414 no.3316-, 92	-
dc.title	Successive sampling and software reliability	-
Appears in Collections:	MIT Items

Files in This Item:

There are no files associated with this item.

DSpace JSPUI