Software reliability modeling and exponential order statistics

Please use this identifier to cite or link to this item: http://dspace.mediu.edu.my:8181/xmlui/handle/1721.1/2291

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DC Field	Value	Language
dc.contributor	Andreatta, Giovanni.	-
dc.contributor	Kaufman, Gordon M.	-
dc.contributor	Sloan School of Management.	-
dc.date	2003-04-29T05:03:12Z	-
dc.date	2003-04-29T05:03:12Z	-
dc.date	1990	-
dc.date.accessioned	2013-06-01T00:10:56Z	-
dc.date.available	2013-06-01T00:10:56Z	-
dc.date.issued	2013-06-01	-
dc.identifier	3114-90MS	-
dc.identifier	http://hdl.handle.net/1721.1/2291	-
dc.identifier.uri	http://koha.mediu.edu.my:8181/jspui/handle/1721	-
dc.description	by Giovanni Andreatta and Gordon M. Kaufman.	-
dc.description	Includes bibliographical references (p. 44-45).	-
dc.description	Supported by the AFOSR. AFOSR-89-0371	-
dc.format	45 p.	-
dc.format	1957799 bytes	-
dc.format	application/pdf	-
dc.language	eng	-
dc.publisher	Sloan School of Management, Massachusetts Institute of Technology	-
dc.relation	Working paper (Sloan School of Management) ; 3114-90.	-
dc.subject	HD28 .M414 no.3114-, 90	-
dc.title	Software reliability modeling and exponential order statistics	-
Appears in Collections:	MIT Items

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