Please use this identifier to cite or link to this item: http://dspace.mediu.edu.my:8181/xmlui/handle/10261/3794
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dc.creatorEscalera, Sara-
dc.creatorGarcía-González, José Manuel-
dc.creatorGuerra, Oscar-
dc.creatorRosa, José M. de la-
dc.creatorMedeiro, Fernando-
dc.creatorPérez-Verdú, Belén-
dc.creatorRodríguez-Vázquez, Ángel-
dc.date2008-04-28T11:10:36Z-
dc.date2008-04-28T11:10:36Z-
dc.date2004-05-
dc.date.accessioned2017-01-31T01:04:37Z-
dc.date.available2017-01-31T01:04:37Z-
dc.identifierS. Escalera, J.M. García-González, O. Guerra, J.M. de la Rosa, F. Medeiro, B. Pérez-Verdú and A. Rodríguez-Vázquez: "An Alternative DfT Methodology to Test High-Resolution ΣΔ Modulator". Proceeding of the 2004 International Symposium on Circuits and Systems (ISCAS), pp. I.257-I.260, Vancouver, May 2004.-
dc.identifierhttp://hdl.handle.net/10261/3794-
dc.identifier0-7803-8251-X/04-
dc.identifier.urihttp://dspace.mediu.edu.my:8181/xmlui/handle/10261/3794-
dc.descriptionIn this paper, a novel DfT methodology to test high-resolution ΣΔ Modulators (ΣΔM) is introduced. The aim of the proposal is to reduce the test time required by conventional methodologies without degrading the accuracy of the results. A detailed description of the additional circuitry needed to perform these tests is presented as well as some initial simulation results to show the utility of the approach.-
dc.descriptionPeer reviewed-
dc.format450773 bytes-
dc.formatapplication/pdf-
dc.languageeng-
dc.publisherInstitute of Electrical and Electronics Engineers-
dc.rightsopenAccess-
dc.subjectDesign for Testability-
dc.subjectSigma-Delta Modulators-
dc.titleAn Alternative DfT Methodology to Test High-Resolution ΣΔ Modulators-
dc.typeArtículo-
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