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Showing results 1 to 10 of 10

Issue Date	Title	Author(s)
9-Oct-2013	An x-ray method for measuring the thickness of thin crystalline films	Eisenstein, A. S.
-	Anisotropic conductivity of silver thin films grown on silicon (100) vicinal surfaces	-
1-Jun-2013	Computer-aided electronic circuit design	Massachusetts Institute of Technology. Electronic Systems Laboratory.
-	Dependencia con el espesor de las propiedades ferroeléctricas de láminas con orientación preferente sobre substratos basados en silicio	-
-	Efecto del argon en películas CNxHy depositadas mediante ECR-CVD	-
9-Oct-2013	Growth and Characterization of LiCoO₂ Thin Films for Microbatteries	-
1-Jun-2013	Part I, Computer-aided electronic circuit design : Part II, Thin-film active device investigations	Massachusetts Institute of Technology. Electronic Systems Laboratory. Computer-aided circuit design.; Massachusetts Institute of Technology. Electronic Systems Laboratory.
-	PbTiO3 modificado con Ca: de la cerámica a la lámina	-
-	Preferential orientation of ferroelectric calcium modified lead titanate thin films grown on various substrates	-
-	Recubrimientos ópticos en el rango espectral entre 50 y 200 nm	-

Showing results 1 to 10 of 10